Edwin Versteeg

Assistant Professor

Recent publications

Simultaneous Gadolinium-free MR Angiography, Venography and Relaxometry using a fast 3D MR-STAT protocol Bas Schilder, Stefano Mandija, Hanna Liu, Edwin Versteeg, Miha Fuderer, Oscar van der Heide, Mark Haacke, Thierry Meerbothe, Tom Snijders, P Robe, Nico van den Berg, Alessandro Sbrizzi
2025, p.1210
More accurate synthetic MRI to shorten clinical protocols F Xu, Edwin Versteeg, Oscar van der Heide, Kyung Min Nam, Stefano Mandija, Bas Schilder, P Robe, Tom Snijders, Nico van den Berg, Alessandro Sbrizzi
2025, p.5214
Implicit neural representations for accurate estimation of the standard model of white matter Tom Hendriks, Gerrit Arends, Edwin Versteeg, Anna Vilanova, Maxime Chamberland, Chantal M W Tax
2025
Efficient estimation of gadolinium-based contrast agent concentration using transient-state keyhole MR-STAT Fei Xu, Edwin Versteeg, Hongyan Liu, Miha Fuderer, Oscar van den Heide, Wybe J M van der Kemp, Cornelis A T van den Berg, Alessandro Sbrizzi
Medical physics, 2025, vol. 52
Towards clinical implementation of T2-weighted cine imaging for intrafraction drift correction workflows on the 1.5 Tesla magnetic resonance-linear accelerator Lieke T.C. Meijers, Johannes C.J. de Boer, Jochem R.M. van de Voort van Zyp, Nicole G.P.M. Vissers, Reijer H.A. Rutgers, Eveline Alberts, Jasmijn M. Westerhoff, Alice M. Couwenberg, Marieke I. Snijder-van As, Stefano Mandija, Edwin Versteeg, Martijn P.W. Intven, Bas W. Raaymakers, Astrid L.H.M.W. van Lier
Physics and Imaging in Radiation Oncology, 2025, vol. 36
Repeatability and reproducibility of joint T1-T2 transient-state relaxometry across multiple vendors and implementations at 3T in phantom and human brain Marta Lancione, Matteo Cencini, Domenico Aquino, Cristina Baldoli, Maurizio Elia, Francesco Ghielmetti, Domenico Montanaro, Ilaria Neri, Anna Nigri, Rosa Pasquariello, Salvatore Pettinato, Salvatore Romano, Alessandro Sbrizzi, Paola Scifo, Oscar van der Heide, Edwin Versteeg, Laura Biagi, Michela Tosetti
NeuroImage, 2025, vol. 320