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FEI SCIOS FIB SEM scanning electron microscope

(Immuno)-electron microscopy

Technical details of the electron microscope:

Microscope: FEI SCIOS FIB SEM
Max acc voltage: 30 KV
Filament: N.Col
STEM: –
Cryostage: –
CCD camera: –
Plate camera: –
Special features: –

Facilities where you can find this equipment:

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